Scanning Electron Microscope (SEM Technology)

Dr. A. Peretti presents a scanning electron microscope (SEM).	Scanning electron microscope
The SEM is also used for criminal detections of particles and for environmental investigations (including geological research) in Switzerland.	The machine is adapted and modified for chemical analysis of particles, which can be so small, that they are not visible to the naked eye or even at microscopic magnifications. Pictures of inclusions reaching the surface up to 100,000 times magnification can be seen and chemically analyzed at the same time.
All chemical elements can be detected including Bor (e.g. Borax). Therefore this machine can be used for investigation of cavity filling of enhanced rubies (deciding whether an inclusion is foreign material or natural), fissure filling that reaches the surface (decision whether is glass, Borax, or natural) and identification of mineral inclusions (whether a gemstone is synthetic or natural).	Recent successful gemmological application. Moissanite, the new imitation for diamond, was detected (Moissanite is chemically SiC and Diamond only C).